Model: DR - COS - SAM100
Test object application
COS chip/C-MOUNT chip;COS chip /C- Mounting chip
Features
Semi-automatic design, independent setting of decision conditions;
Simple loading, alternating use of double fixture;
It can be loaded during the test, reasonable use of time, promote efficiency;
It can be tested individually or in a series of tests;
High measurement accuracy, Kelvin four-line measurement;
Automatically complete tests and print reports;
Can be customized according to customer needs;
Functions
LIV test: the test module is composed of PD detector and integrating sphere, current scan test, draw LIV curve automatically;
Spectral measurement: the test module is composed of spectrometer, optical fiber and integrating sphere, real-time spectrum drawing;
Far-field Angle test: The angle of the far-field scanning path can be set arbitrarily and the angle chart of the far-field divergence can be drawn automatically;