Introduction
Use to test the parameter performance of the side emission bar semiconductor laser chip, including LIV test, spectrum test, far field divergence angle test and so on, the working current IO, output optical power PO, slope efficiency SE, series resistance Rs, threshold current Ith, central wavelength λc, spectral width δλ, kink current Ikink, kink power Pkink, root mean square, side mode rejection ratio SMSR can be fully measured or calculated.
Features
Function modular design, optional as required
Manual feeding, simple loading
Automatic design, automatic calibration, industrial vision identification and positioning
Two-wire/four-wire measurement
CCD far-field Angle measurement method
High measurement accuracy, stable performance
Intelligent design, cutting and sorting, Set the decision conditions independently, automatic completion of the test process and print the report
Comprehensive performance test of side-emitting laser chip BAR
