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Comprehensive Performance Tester of COS/C-Mount/TO modules
Release time:2019-05-30 18:59



Description
COS/C-Mount/TO modules Tester is a test equipment which is used to test COS/C-Mount/TO-packaged chips. The equipment allows users to acquire the major parameters of including LIV characteristics, spectrum, far-field divergence angle etc. It is also capable of finding out main parameters such as operation current (Io), output power (Po), slope efficiency (SE), serious resistance (Rs), threshold current (Ith), central wavelength (λc) as well as spectrum line width (Δλ). COS/C-Mount/TO modules Tester is cost-effective for its modular design, as the functions can be customized based on customers’ needs. The semi-automated design of the equipment is able to conduct batch test, and automatically generate a test report which summarizes the main parameter’s characteristics.
Features
-Functional module design and on-demand customization
-Manual feeding, semi-automatic design, probing multiple chips to perform test and easy to load and unload
-Two-line/four-line measurement
-High accuracy of measurement and reliable performance
-Automatic execution of packaged laser chips testing process, produce a test report
 
Applications
It is suitable for comprehensive performance test of COS/C-Mount and other packaged chips.